In situ analysis of small opacities by high resolution techniques

J.J. Duindam, G.F.J.M. Vrensen

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationNeuherberg
    Publication statusPublished - 24 Feb 1996

    Keywords

    • METIS-131476

    Cite this

    Duindam, J. J., & Vrensen, G. F. J. M. (1996, Feb 24). In situ analysis of small opacities by high resolution techniques. Neuherberg.
    Duindam, J.J. ; Vrensen, G.F.J.M. / In situ analysis of small opacities by high resolution techniques. 1996. Neuherberg.
    @misc{35d5c2247730466f8c8a9284d4999496,
    title = "In situ analysis of small opacities by high resolution techniques",
    keywords = "METIS-131476",
    author = "J.J. Duindam and G.F.J.M. Vrensen",
    year = "1996",
    month = "2",
    day = "24",
    language = "Undefined",
    type = "Other",

    }

    Duindam, JJ & Vrensen, GFJM 1996, In situ analysis of small opacities by high resolution techniques. Neuherberg.

    In situ analysis of small opacities by high resolution techniques. / Duindam, J.J.; Vrensen, G.F.J.M.

    Neuherberg. 1996, .

    Research output: Other contributionOther research output

    TY - GEN

    T1 - In situ analysis of small opacities by high resolution techniques

    AU - Duindam, J.J.

    AU - Vrensen, G.F.J.M.

    PY - 1996/2/24

    Y1 - 1996/2/24

    KW - METIS-131476

    M3 - Other contribution

    CY - Neuherberg

    ER -