In Situ Characterization Tools for Bi2Te3 Topological Insulator Nanomaterials

Prosper Ngabonziza, M.P. Stehno, G. Koster, Alexander Brinkman

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Abstract

In situ characterization of topological insulator nanomaterials using several, complementary surface analysis techniques enables to investigate topological surface states without exposing the samples to ambient conditions. Adsorbants from exposure to air and other ex situ contaminations result in notable changes in the bulk and surface state properties of topological insulators. In this chapter, we describe recent developments in the in situ characterization of topological insulator nanomaterials. Extensive studies on individual samples are made possible by connecting the deposition chamber to a large number of surface analysis tools and by using a vacuum suitcase technology which allows sample transfer in ultra-high vacuum conditions between vacuum systems worldwide.
Original languageEnglish
Title of host publicationIn-situ Characterization Techniques for Nanomaterials
PublisherSpringer
Chapter7
Pages223-250
Number of pages28
ISBN (Electronic)9783662563229
ISBN (Print)9783662563212
DOIs
Publication statusPublished - 17 Apr 2018

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Ngabonziza, P., Stehno, M. P., Koster, G., & Brinkman, A. (2018). In Situ Characterization Tools for Bi2Te3 Topological Insulator Nanomaterials. In In-situ Characterization Techniques for Nanomaterials (pp. 223-250). Springer. https://doi.org/10.1007/978-3-662-56322-9_7