In situ characterization of topological insulator nanomaterials using several, complementary surface analysis techniques enables to investigate topological surface states without exposing the samples to ambient conditions. Adsorbants from exposure to air and other ex situ contaminations result in notable changes in the bulk and surface state properties of topological insulators. In this chapter, we describe recent developments in the in situ characterization of topological insulator nanomaterials. Extensive studies on individual samples are made possible by connecting the deposition chamber to a large number of surface analysis tools and by using a vacuum suitcase technology which allows sample transfer in ultra-high vacuum conditions between vacuum systems worldwide.
|Title of host publication||In-situ Characterization Techniques for Nanomaterials|
|Number of pages||28|
|Publication status||Published - 17 Apr 2018|