In situ growth monitoring of sputtered YBa2Cu3O6+x thin films by spectroscopic ellipsometry

Research output: Other contribution › Other research output

Keywords

@misc{047dc0a76ef94547b94b6592152768eb,

title = "In situ growth monitoring of sputtered YBa2Cu3O6+x thin films by spectroscopic ellipsometry",

keywords = "METIS-131244",

author = "M.E. Bijlsma and Herbert Wormeester and Blank, \{David H.A.\} and \{van Silfhout\}, Arend and Horst Rogalla",

year = "1995",

month = apr,

day = "17",

language = "Undefined",

type = "Other",

}