In situ growth monitoring of YBa2Cu3Ox thin films by spectroscopic ellipsometry

M.E. Bijlsma, Herbert Wormeester, Arend van Silfhout, Horst Rogalla

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 20 Jun 1994
Event	AIO-Workshop on Material Growth 1994 - Ameland, Netherlands Duration: 20 Jun 1994 → 20 Jun 1994

Conference	AIO-Workshop on Material Growth 1994
Country/Territory	Netherlands
City	Ameland
Period	20/06/94 → 20/06/94

Keywords

@conference{53494670899c49f49e87f8e09856e86f,

title = "In situ growth monitoring of YBa2Cu3Ox thin films by spectroscopic ellipsometry",

keywords = "METIS-133287",

author = "M.E. Bijlsma and Herbert Wormeester and {van Silfhout}, Arend and Horst Rogalla",

year = "1994",

month = jun,

day = "20",

language = "Undefined",

pages = "--",

note = "AIO-Workshop on Material Growth 1994 ; Conference date: 20-06-1994 Through 20-06-1994",

}