In situ growth monitoring of YBa2Cu3Ox thin films by spectroscopic ellipsometry

M.E. Bijlsma, Herbert Wormeester, Arend van Silfhout, Horst Rogalla

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 20 Jun 1994
EventAIO-Workshop on Material Growth 1994 - Ameland, Netherlands
Duration: 20 Jun 199420 Jun 1994

Conference

ConferenceAIO-Workshop on Material Growth 1994
CountryNetherlands
CityAmeland
Period20/06/9420/06/94

Keywords

  • METIS-133287

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