In situ spectroscopy of intrinsic Bi2Te3 topological insulator thin films and impact of extrinsic defects

P. Ngabonziza, R. Heimbuch, N. de Jong, R.A. Klaassen, M.P. Stehno, M. Snelder, A. Solmaz, S.V. Ramankutty, E. Frantzeskakis, E. van Heumen, G. Koster, M.S. Golden, H.J.W. Zandvliet, A. Brinkman

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Abstract

Combined in situ x-ray photoemission spectroscopy, scanning tunneling spectroscopy, and angle resolved photoemission spectroscopy of molecular beam epitaxy grown Bi2Te3 on lattice mismatched substrates reveal high quality stoichiometric thin films with topological surface states without a contribution from the bulk bands at the Fermi energy. The absence of bulk states at the Fermi energy is achieved without counterdoping. We observe that the surface morphology and electronic band structure of Bi2Te3 are not affected by in vacuo storage and exposure to oxygen, whereas major changes are observed when exposed to ambient conditions. These films help define a pathway towards intrinsic topological devices.

Original languageEnglish
Article number035405
Pages (from-to)035405-
JournalPhysical Review B (Condensed Matter and Materials Physics)
Volume92
Issue number3
DOIs
Publication statusPublished - 6 Jul 2015

Keywords

  • 2023 OA procedure

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