In-situ X-ray Diffraction during Pulsed Laser Deposition

Vedran Vonk, Kurt Driessen, Mark Huijben, Sybolt Harkema, H. Graafsma

    Research output: Contribution to journalMeeting AbstractOther research output

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    Original languageEnglish
    Pages (from-to)c442-c443
    Number of pages2
    JournalActa crystallographica Section A: Foundations of crystallography
    Volume61
    Issue numberSuppl.
    DOIs
    Publication statusPublished - 23 Aug 2005
    Event20th Congress and General Assembly of the International Union of Crystallography 2005 - Fortezza da Basso, Florence, Italy
    Duration: 23 Aug 200531 Aug 2005
    Conference number: 20

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