Incorporating design-for-testability in a silicon compiler

R.P. van Riessen, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing
Place of Publication	Dalfsen
Pages	181-188
Number of pages	0
Publication status	Published - 1 Apr 1991

Keywords

@inproceedings{801bf8195e864ee68e5ba332f4d0c802,

title = "Incorporating design-for-testability in a silicon compiler",

keywords = "METIS-112964",

author = "{van Riessen}, R.P. and Kerkhoff, {Hans G.}",

year = "1991",

month = apr,

day = "1",

language = "Undefined",

pages = "181--188",

booktitle = "Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing",

}