Incorporating design-for-testability in a silicon compiler

R.P. van Riessen, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing
    Place of PublicationDalfsen
    Pages181-188
    Number of pages0
    Publication statusPublished - 1 Apr 1991

    Keywords

    • METIS-112964

    Cite this

    van Riessen, R. P., & Kerkhoff, H. G. (1991). Incorporating design-for-testability in a silicon compiler. In Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing (pp. 181-188). Dalfsen.
    van Riessen, R.P. ; Kerkhoff, Hans G. / Incorporating design-for-testability in a silicon compiler. Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing. Dalfsen, 1991. pp. 181-188
    @inproceedings{801bf8195e864ee68e5ba332f4d0c802,
    title = "Incorporating design-for-testability in a silicon compiler",
    keywords = "METIS-112964",
    author = "{van Riessen}, R.P. and Kerkhoff, {Hans G.}",
    year = "1991",
    month = "4",
    day = "1",
    language = "Undefined",
    pages = "181--188",
    booktitle = "Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing",

    }

    van Riessen, RP & Kerkhoff, HG 1991, Incorporating design-for-testability in a silicon compiler. in Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing. Dalfsen, pp. 181-188.

    Incorporating design-for-testability in a silicon compiler. / van Riessen, R.P.; Kerkhoff, Hans G.

    Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing. Dalfsen, 1991. p. 181-188.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Incorporating design-for-testability in a silicon compiler

    AU - van Riessen, R.P.

    AU - Kerkhoff, Hans G.

    PY - 1991/4/1

    Y1 - 1991/4/1

    KW - METIS-112964

    M3 - Conference contribution

    SP - 181

    EP - 188

    BT - Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing

    CY - Dalfsen

    ER -

    van Riessen RP, Kerkhoff HG. Incorporating design-for-testability in a silicon compiler. In Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing. Dalfsen. 1991. p. 181-188