Incorporating design-for-testability in a silicon compiler

R.P. van Riessen, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing
    Place of PublicationDalfsen
    Pages181-188
    Number of pages0
    Publication statusPublished - 1 Apr 1991

    Keywords

    • METIS-112964

    Cite this

    van Riessen, R. P., & Kerkhoff, H. G. (1991). Incorporating design-for-testability in a silicon compiler. In Proc. IEEE/ProRisc symp. on Circuits, Systems and Signal Processing (pp. 181-188). Dalfsen.