Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE International On-Line Testing Workshop
Place of Publication	Giardini Naxos, Italy
Pages	95-99
Number of pages	5
Publication status	Published - 9 Jul 2001
Event	IEEE International On-Line Testing Workshop: Proceedings of the IEEE International On-Line Testing Workshop - Giardini Naxos, Italy Duration: 9 Jul 2001 → 11 Jul 2001

Conference	IEEE International On-Line Testing Workshop
City	Giardini Naxos, Italy
Period	9/07/01 → 11/07/01

Keywords

@inproceedings{e63274acbc5546698301ba1f757b5331,

title = "Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers",

keywords = "METIS-201875",

author = "O. Petre and Kerkhoff, {Hans G.}",

year = "2001",

month = jul,

day = "9",

language = "Undefined",

isbn = "0-7695-1290-9",

pages = "95--99",

booktitle = "Proceedings of the IEEE International On-Line Testing Workshop",

note = "null ; Conference date: 09-07-2001 Through 11-07-2001",

}

TY - GEN

T1 - Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers

AU - Petre, O.

AU - Kerkhoff, Hans G.

PY - 2001/7/9

Y1 - 2001/7/9

KW - METIS-201875

M3 - Conference contribution

SN - 0-7695-1290-9

SP - 95

EP - 99

BT - Proceedings of the IEEE International On-Line Testing Workshop

CY - Giardini Naxos, Italy

Y2 - 9 July 2001 through 11 July 2001

ER -