Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers

O. Petre, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE International On-Line Testing Workshop
    Place of PublicationGiardini Naxos, Italy
    Number of pages5
    Publication statusPublished - 9 Jul 2001
    EventIEEE International On-Line Testing Workshop: Proceedings of the IEEE International On-Line Testing Workshop - Giardini Naxos, Italy
    Duration: 9 Jul 200111 Jul 2001


    ConferenceIEEE International On-Line Testing Workshop
    CityGiardini Naxos, Italy


    • METIS-201875

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