Incremental Test of Bus-Oriented Designs

A. Fortas, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)
    Place of PublicationWashington, USA
    Number of pages9
    Publication statusPublished - 22 Oct 1998


    • METIS-112989

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