| Original language | Undefined |
|---|---|
| Title of host publication | Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98) |
| Place of Publication | Washington, USA |
| Pages | 231-239 |
| Number of pages | 9 |
| Publication status | Published - 22 Oct 1998 |
Keywords
- METIS-112989
Cite this
Fortas, A., Tangelder, R. J. W. T., & Kerkhoff, H. G. (1998). Incremental Test of Bus-Oriented Designs. In Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98) (pp. 231-239). Washington, USA.
@inproceedings{95ce334347024c719ee6f14270c41746,
title = "Incremental Test of Bus-Oriented Designs",
keywords = "METIS-112989",
author = "A. Fortas and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",
year = "1998",
month = "10",
day = "22",
language = "Undefined",
pages = "231--239",
booktitle = "Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)",
}
Fortas, A, Tangelder, RJWT & Kerkhoff, HG 1998, Incremental Test of Bus-Oriented Designs. in Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA, pp. 231-239.
Incremental Test of Bus-Oriented Designs. / Fortas, A.; Tangelder, R.J.W.T.; Kerkhoff, Hans G.
Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA, 1998. p. 231-239.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - Incremental Test of Bus-Oriented Designs
AU - Fortas, A.
AU - Tangelder, R.J.W.T.
AU - Kerkhoff, Hans G.
PY - 1998/10/22
Y1 - 1998/10/22
KW - METIS-112989
M3 - Conference contribution
SP - 231
EP - 239
BT - Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)
CY - Washington, USA
ER -
Fortas A, Tangelder RJWT, Kerkhoff HG. Incremental Test of Bus-Oriented Designs. In Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA. 1998. p. 231-239