Incremental Test of Bus-Oriented Designs

A. Fortas, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)
    Place of PublicationWashington, USA
    Pages231-239
    Number of pages9
    Publication statusPublished - 22 Oct 1998

    Keywords

    • METIS-112989

    Cite this

    Fortas, A., Tangelder, R. J. W. T., & Kerkhoff, H. G. (1998). Incremental Test of Bus-Oriented Designs. In Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98) (pp. 231-239). Washington, USA.
    Fortas, A. ; Tangelder, R.J.W.T. ; Kerkhoff, Hans G. / Incremental Test of Bus-Oriented Designs. Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA, 1998. pp. 231-239
    @inproceedings{95ce334347024c719ee6f14270c41746,
    title = "Incremental Test of Bus-Oriented Designs",
    keywords = "METIS-112989",
    author = "A. Fortas and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",
    year = "1998",
    month = "10",
    day = "22",
    language = "Undefined",
    pages = "231--239",
    booktitle = "Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)",

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    Fortas, A, Tangelder, RJWT & Kerkhoff, HG 1998, Incremental Test of Bus-Oriented Designs. in Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA, pp. 231-239.

    Incremental Test of Bus-Oriented Designs. / Fortas, A.; Tangelder, R.J.W.T.; Kerkhoff, Hans G.

    Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA, 1998. p. 231-239.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Incremental Test of Bus-Oriented Designs

    AU - Fortas, A.

    AU - Tangelder, R.J.W.T.

    AU - Kerkhoff, Hans G.

    PY - 1998/10/22

    Y1 - 1998/10/22

    KW - METIS-112989

    M3 - Conference contribution

    SP - 231

    EP - 239

    BT - Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)

    CY - Washington, USA

    ER -

    Fortas A, Tangelder RJWT, Kerkhoff HG. Incremental Test of Bus-Oriented Designs. In Proceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98). Washington, USA. 1998. p. 231-239