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Incremental Test of Bus-Oriented Designs

  • A. Fortas
  • , R.J.W.T. Tangelder
  • , Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd IEEE International Workshop of Testing Embedded Core-based System-Chips (TECS'98)
    Place of PublicationWashington, USA
    Pages231-239
    Number of pages9
    Publication statusPublished - 22 Oct 1998

    Keywords

    • METIS-112989

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