Industrial Test Selection based on Test Time and Defect Coverage

N. Engin, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{416148f505f745ee8929cc17f71b4e0b,

title = "Industrial Test Selection based on Test Time and Defect Coverage",

keywords = "METIS-113004",

author = "N. Engin and Kerkhoff, {Hans G.}",

year = "1999",

month = nov,

day = "24",

language = "Undefined",

isbn = "90-73461-18-9",

pages = "139--142",

booktitle = "ProRISC99",

}