Inelastic electron tunneling spectroscopy on decanethiol at elevated temperatures

A.S.V.M. Hallbäck; N. Oncel; Jurriaan Huskens; Henricus J.W. Zandvliet; Bene Poelsema

doi:10.1021/nl0485253

Inelastic electron tunneling spectroscopy on decanethiol at elevated temperatures

A.S.V.M. Hallbäck, N. Oncel, Jurriaan Huskens, Henricus J.W. Zandvliet, Bene Poelsema

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Abstract

Inelastic electron tunneling spectroscopy (IETS) measurements using scanning tunneling microscopy (STM) on a decanethiol self-assembled monolayer on Au(111) are presented. The results presented are obtained in the temperature range 77-300 K, which is a much higher temperature than what is commonly used for STM-IETS measurements. Two peaks at ±34 meV (probably Au-S or S-C stretch mode) and ±156 meV (C-C stretch mode or a CH2 mode) are resolved.

Original language	Undefined
Pages (from-to)	2393-2395
Number of pages	3
Journal	Nano letters
Volume	4
Issue number	12
DOIs	https://doi.org/10.1021/nl0485253
Publication status	Published - 2004

Keywords

IR-59491
METIS-220907

Access to Document

10.1021/nl0485253

Cite this

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title = "Inelastic electron tunneling spectroscopy on decanethiol at elevated temperatures",

abstract = "Inelastic electron tunneling spectroscopy (IETS) measurements using scanning tunneling microscopy (STM) on a decanethiol self-assembled monolayer on Au(111) are presented. The results presented are obtained in the temperature range 77-300 K, which is a much higher temperature than what is commonly used for STM-IETS measurements. Two peaks at ±34 meV (probably Au-S or S-C stretch mode) and ±156 meV (C-C stretch mode or a CH2 mode) are resolved.",

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T1 - Inelastic electron tunneling spectroscopy on decanethiol at elevated temperatures

AU - Hallbäck, A.S.V.M.

AU - Oncel, N.

AU - Huskens, Jurriaan

AU - Zandvliet, Henricus J.W.

AU - Poelsema, Bene

PY - 2004

Y1 - 2004

N2 - Inelastic electron tunneling spectroscopy (IETS) measurements using scanning tunneling microscopy (STM) on a decanethiol self-assembled monolayer on Au(111) are presented. The results presented are obtained in the temperature range 77-300 K, which is a much higher temperature than what is commonly used for STM-IETS measurements. Two peaks at ±34 meV (probably Au-S or S-C stretch mode) and ±156 meV (C-C stretch mode or a CH2 mode) are resolved.

AB - Inelastic electron tunneling spectroscopy (IETS) measurements using scanning tunneling microscopy (STM) on a decanethiol self-assembled monolayer on Au(111) are presented. The results presented are obtained in the temperature range 77-300 K, which is a much higher temperature than what is commonly used for STM-IETS measurements. Two peaks at ±34 meV (probably Au-S or S-C stretch mode) and ±156 meV (C-C stretch mode or a CH2 mode) are resolved.

KW - IR-59491

KW - METIS-220907

U2 - 10.1021/nl0485253

DO - 10.1021/nl0485253

M3 - Article

SN - 1530-6984

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JO - Nano letters

JF - Nano letters

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