Influence of concurrent electrothermal and avalanche effects on the safe operating area of multifinger bipolar transistors

Luigi La Spina, Vincenzo d'Alessandro, Salvatore Russo, Niccolò Rinaldi, Lis K. Nanver

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)

Abstract

The impact of the concurrent action of electrothermal and avalanche effects on the reduction of the safe operating area is experimentally investigated for a wide number of single-, two-, and three-finger bipolar transistors fabricated in SiGe, GaAs, and silicon-on-glass technologies. The results of the analysis are substantiated by a SPICE-like simulation tool that allows the monitoring of the temperatures of the individual fingers and provides an in-depth understanding of the individual influence of the positive feedback mechanisms. Design strategies for minimizing the effects on device operation, like the implementation of ballasting resistors and emitter segmentation, are also analyzed.

Original languageEnglish
Pages (from-to)483-491
Number of pages9
JournalIEEE transactions on electron devices
Volume56
Issue number3
DOIs
Publication statusPublished - 1 Jan 2009

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Bipolar transistors
SPICE
Silicon
Resistors
Feedback
Glass
Monitoring
Temperature
gallium arsenide

Keywords

  • Avalanche effect
  • Ballasting resistors
  • Bipolar junction transistor (BJT)
  • Breakdown voltage
  • Electrothermal effects
  • Emitter ballasting
  • Emitter segmentation
  • Heterojunction bipolar transistor (HBT)
  • Impact ionization (II)
  • Multifinger transistor
  • Safe operating area (SOA)
  • Self-heating
  • Silicon-on-glass (SOG)
  • Thermal coupling
  • Thermal instability
  • Thermal resistance

Cite this

La Spina, Luigi ; d'Alessandro, Vincenzo ; Russo, Salvatore ; Rinaldi, Niccolò ; Nanver, Lis K. / Influence of concurrent electrothermal and avalanche effects on the safe operating area of multifinger bipolar transistors. In: IEEE transactions on electron devices. 2009 ; Vol. 56, No. 3. pp. 483-491.
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Influence of concurrent electrothermal and avalanche effects on the safe operating area of multifinger bipolar transistors. / La Spina, Luigi; d'Alessandro, Vincenzo; Russo, Salvatore; Rinaldi, Niccolò; Nanver, Lis K.

In: IEEE transactions on electron devices, Vol. 56, No. 3, 01.01.2009, p. 483-491.

Research output: Contribution to journalArticleAcademicpeer-review

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AU - Nanver, Lis K.

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