Remanent magnetization curves of perpendicular magnetic thin films are simulated and measured. The simulations are used to investigate the theoretical influence of the strong demagnetizing field present in these films. Conclusions are drawn from this on how remanence curves should be measured and how they should be corrected for the demagnetizing influence. The experimental part consists of measurements on Fe‐Alumite, Co‐Pt–based multilayers, and Co‐Cr. In addition the latter material is also artificially patterned into microstrips in order to investigate the influence of demagnetization on remanence curves experimentally.
- SMI-TST: From 2006 in EWI-TST
- SMI-EXP: EXPERIMENTAL TECHNIQUES