Influence of mutual coupling on parasitic capacitance in common mode chokes

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    In the search for a physics based model for a Common Mode Choke (CMC), the high frequency behavior of a multitude of chokes is studied. The high frequency behavior (above self-resonance) is often regarded as purely capacitive, while actually/obviously it has an inductive origin as well. The goal of this paper is to highlight and characterize this behavior and to warn for a common misconception
    Original languageEnglish
    Title of host publication2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility
    PublisherIEEE Electromagnetic Compatibility Society
    Pages1305-1309
    Number of pages5
    ISBN (Electronic)978-1-5090-5997-3
    ISBN (Print)978-1-5090-3955-5
    DOIs
    Publication statusPublished - 25 Jun 2018
    EventIEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility 2018 - Suntec City, Singapore, Singapore
    Duration: 14 May 201817 May 2018

    Conference

    ConferenceIEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility 2018
    Abbreviated titleEMC/APEMC 2018
    CountrySingapore
    CitySingapore
    Period14/05/1817/05/18

    Fingerprint

    Electric inductors
    Capacitance
    Physics

    Cite this

    Moonen, D. J. G., Roc'h, A., & Leferink, F. (2018). Influence of mutual coupling on parasitic capacitance in common mode chokes. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (pp. 1305-1309). IEEE Electromagnetic Compatibility Society. https://doi.org/10.1109/ISEMC.2018.8394000
    Moonen, Dominicus Johannes Guilielmus ; Roc'h, Anne ; Leferink, Frank. / Influence of mutual coupling on parasitic capacitance in common mode chokes. 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility. IEEE Electromagnetic Compatibility Society, 2018. pp. 1305-1309
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    title = "Influence of mutual coupling on parasitic capacitance in common mode chokes",
    abstract = "In the search for a physics based model for a Common Mode Choke (CMC), the high frequency behavior of a multitude of chokes is studied. The high frequency behavior (above self-resonance) is often regarded as purely capacitive, while actually/obviously it has an inductive origin as well. The goal of this paper is to highlight and characterize this behavior and to warn for a common misconception",
    author = "Moonen, {Dominicus Johannes Guilielmus} and Anne Roc'h and Frank Leferink",
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    Moonen, DJG, Roc'h, A & Leferink, F 2018, Influence of mutual coupling on parasitic capacitance in common mode chokes. in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility. IEEE Electromagnetic Compatibility Society, pp. 1305-1309, IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility 2018, Singapore, Singapore, 14/05/18. https://doi.org/10.1109/ISEMC.2018.8394000

    Influence of mutual coupling on parasitic capacitance in common mode chokes. / Moonen, Dominicus Johannes Guilielmus; Roc'h, Anne ; Leferink, Frank.

    2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility. IEEE Electromagnetic Compatibility Society, 2018. p. 1305-1309.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Moonen DJG, Roc'h A, Leferink F. Influence of mutual coupling on parasitic capacitance in common mode chokes. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility. IEEE Electromagnetic Compatibility Society. 2018. p. 1305-1309 https://doi.org/10.1109/ISEMC.2018.8394000