Abstract
PECVD Phosphorus-doped silicon oxynitride layers (n=1.5) were deposited from $N_20$, 2%$SiH_4N_2$, $NH_3$ and 5%$PH_3/Ar$ gaseous mixtures. Chemical bonds were determined by Fourier transform infrared spectroscopy. N-H bond concentration of the layers decreased from 3.29 x $10^{21}$ to 0.45 x $10^{21}$ $cm^{-3}$ as the 5%$PH_3/Ar$ flow rate increased from 0 to 60 sccm. A simultaneous decrease of 0-H related bonds was also observed within the same phosphine flow range. The optical loss of slab-type waveguides at λ =1505 nm was found to decrease from 14.1 to 6.2 dB/cm as the 5%$PH_3/Ar$ flow rate increased from 0 to 30 sccm, respectively. Moreover, the optical loss values around λ= 1400 and 1550 nm were found to decrease from 4.7 to below 0.2 dB/cm and from 1.8 to I. 0 dB/cm respectively. These preliminary results are very promising for applications in low-loss integrated optical devices.
Original language | English |
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Title of host publication | Symposium IEEE/LEOS Benelux (Lasers and Electro-Optics Society) |
Editors | P. Megret, M. Wuilpart, S. Bette, N. Staquet |
Place of Publication | Mons, Belgium |
Publisher | IEEE |
Pages | 101-104 |
Number of pages | 4 |
ISBN (Print) | 2-9600226-4-5 |
Publication status | Published - 1 Dec 2005 |
Event | 10th Annual Symposium of the IEEE/LEOS Benelux Chapter 2005 - Mons, Belgium Duration: 1 Dec 2008 → 2 Dec 2008 Conference number: 10 |
Conference
Conference | 10th Annual Symposium of the IEEE/LEOS Benelux Chapter 2005 |
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Country/Territory | Belgium |
City | Mons |
Period | 1/12/08 → 2/12/08 |
Keywords
- METIS-228223
- EWI-12354
- IR-58220
- IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY