Influence of substrate-film interface engineering on the superconducting properties of Yba2Cu3O7-d

Augustinus J.H.M. Rijnders, Steve Curras, S. Rodrigues Curras, Mark Huijben, David H.A. Blank, Horst Rogalla

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Abstract

The atomic stacking sequence at the substrate-film interface plays an essential role in the heteroepitaxial growth of REBa2Cu3O7-d. During initial growth, the interface configuration influences the surface morphology and structural properties of the film, due to the formation of anti-phase boundaries (APBs) by coalescence of islands with different stacking sequences. In this study, the interface configuration is accurately controlled by both the terminating atomic layer of the SrTiO3 substrate and the stoichiometry of the first unit cell layer. Using this capability the network of APBs and, therefore, the in-plane ordering is tuned, allowing the study of its influence on the structural and electrical properties of the YBa2Cu3O7-d film. The critical temperature Tc is depressed by increase of the in-plane ordering, which strongly indicates that the presence of APBs in the sample favors the oxygen in-diffusion.
Original languageEnglish
Pages (from-to)1150-1152
Number of pages3
JournalApplied physics letters
Volume84
Issue number7
DOIs
Publication statusPublished - 2004

Keywords

  • METIS-218559
  • IR-47719

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