Influence of tip indentation on the adhesive behavior of viscoelastic polydimethylsiloxane networks studied by atomic force microscopy

J.P. Pickering, Gyula J. Vancso

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Abstract

A commercial atomic force microscope (AFM) outfitted with a custom control and data acquisition system was used to investigate the adhesive nature of a viscoelastic polydimethylsiloxane (PDMS) network. Due to the complex dependence of the adhesion of this sample on factors such as indentation, surface dwell time, applied stress and sample memory effects, total control of the applied stress profile between the AFM tip and sample was necessary. Since the force curves were analyzed automatically on-line, large amounts of data could be rapidly collected, alleviating the time-consuming task of off-line analysis. The adhesive response is shown to increase with increasing interaction time and the maximum applied load. The results are rationalized by considering the time-dependent stress relaxation behavior of the PDMS network as it is deformed by the AFM tip.
Original languageUndefined
Title of host publicationMacromolecular Symposia
PublisherInternational Union of Pure and Applied Chemistry
Pages189-199
Number of pages11
DOIs
Publication statusPublished - 2001
EventMacromolecules Symposia: Macromolecular Symposia -
Duration: 1 Jan 1900 → …

Publication series

Name
PublisherInternational Union of Pure and Applied Chemistry
Number166
Volume167
ISSN (Print)1022-1360

Conference

ConferenceMacromolecules Symposia
Period1/01/00 → …

Keywords

  • METIS-204619
  • IR-71816

Cite this