Abstract
We present a method for calibrating the response of a phase-only spatial light modulator in nonlinear microscopy. Our method uses the microscope image itself as a calibration measurement and requires no additional hardware components. It is adapted to the nonlinear signals encountered in multi-photon excitation fluorescence microscopes and works well even under low-light conditions and with strong photobleaching.
| Original language | English |
|---|---|
| Pages (from-to) | 6991-6996 |
| Number of pages | 6 |
| Journal | Applied Optics |
| Volume | 64 |
| Issue number | 24 |
| DOIs | |
| Publication status | Published - 13 Aug 2025 |
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