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Inline calibration of spatial light modulators in nonlinear microscopy

  • Daniël W.S. Cox*
  • , Harish Sasikumar
  • , Ivo M. Vellekoop
  • *Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

We present a method for calibrating the response of a phase-only spatial light modulator in nonlinear microscopy. Our method uses the microscope image itself as a calibration measurement and requires no additional hardware components. It is adapted to the nonlinear signals encountered in multi-photon excitation fluorescence microscopes and works well even under low-light conditions and with strong photobleaching.

Original languageEnglish
Pages (from-to)6991-6996
Number of pages6
JournalApplied Optics
Volume64
Issue number24
DOIs
Publication statusPublished - 13 Aug 2025

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