Integrated AWG spectrometer for on-chip optical coherence tomography and Raman spectroscopy

B.I. Akça, N. Ismail, F. Sun, A. Driessen, Kerstin Worhoff, Markus Pollnau, R.M. de Ridder, V.D. Nguyen, J. Kalkman, Ton van Leeuwen

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Abstract

Silicon oxynitride-based arrayed waveguide grating (AWG) spectrometers were designed for on-chip spectral-domain optical coherence tomography (OCT) systems and Raman spectroscopy of the skin. A novel geometrical layout for Raman spectroscopy was introduced to reduce loss. Measurements show that integrated optics has a good potential for miniaturizing current OCT systems.
Original languageEnglish
Title of host publication15th European Conference on Integrated Optics (ECIO)
Place of PublicationUK
PublisherIEEE Photonics Society
PagesWeB1
Number of pages2
Publication statusPublished - 2010
Event15th European Conference on Integrated Optics, ECIO 2010 - University of Cambridge, Cambridge, United Kingdom
Duration: 7 Apr 20109 Apr 2010
Conference number: 15

Conference

Conference15th European Conference on Integrated Optics, ECIO 2010
Abbreviated titleECIO
CountryUnited Kingdom
CityCambridge
Period7/04/109/04/10

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    Akça, B. I., Ismail, N., Sun, F., Driessen, A., Worhoff, K., Pollnau, M., ... van Leeuwen, T. (2010). Integrated AWG spectrometer for on-chip optical coherence tomography and Raman spectroscopy. In 15th European Conference on Integrated Optics (ECIO) (pp. WeB1). UK: IEEE Photonics Society.