Integrated AWG spectrometer for on-chip optical coherence tomography and Raman spectroscopy

B.I. Akça, N. Ismail, F. Sun, A. Driessen, Kerstin Worhoff, Markus Pollnau, R.M. de Ridder, V.D. Nguyen, J. Kalkman, Ton van Leeuwen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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