Integrated Design and Test of Mixed-signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop
    Place of PublicationBarcelona, Spain
    Number of pages5
    Publication statusPublished - 27 May 1998


    • METIS-112988

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