Integrated Design and Test of Mixed-Signal Circuits

N. Engin, Hans G. Kerkhoff, R.J.W.T. Tangelder, H. Speek

    Research output: Contribution to journalArticleAcademicpeer-review

    1 Citation (Scopus)
    Original languageUndefined
    Pages (from-to)75-83
    Number of pages9
    JournalJournal of electronic testing
    Volume1999
    Issue number1/2
    Publication statusPublished - 1999

    Keywords

    • METIS-111662

    Cite this

    Engin, N., Kerkhoff, H. G., Tangelder, R. J. W. T., & Speek, H. (1999). Integrated Design and Test of Mixed-Signal Circuits. Journal of electronic testing, 1999(1/2), 75-83.