Integrated optics refractometry: sensitivity in relation to spectral shifts

Hugo Hoekstra, M. Hammer (Editor)

    Research output: Contribution to conferenceAbstract

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    Abstract

    A new variant of the Vernier-effect based sensor reported in ref. 1 is introduced. Both sensor types may show a huge index induced spectral shift. It will be shown in a poster presentation that with such sensors, as well as with surface plasmon based sensors, the constraints on the spectral resolution of the read out are strongly relaxed, but the sensitivity is not increased (unlike what is often reported in the literature).
    Original languageUndefined
    Pages17-17
    Number of pages1
    Publication statusPublished - 19 Apr 2013
    Event21st International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling, OWTNM 2013 - University of Twente, Enschede, Netherlands
    Duration: 19 Apr 201320 Apr 2013
    Conference number: 21
    https://www.owtnm-workshop.org/

    Conference

    Conference21st International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling, OWTNM 2013
    Abbreviated titleOWTNM
    CountryNetherlands
    CityEnschede
    Period19/04/1320/04/13
    Internet address

    Keywords

    • EWI-23333
    • IR-86015
    • METIS-295733

    Cite this

    Hoekstra, H., & Hammer, M. (Ed.) (2013). Integrated optics refractometry: sensitivity in relation to spectral shifts. 17-17. Abstract from 21st International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling, OWTNM 2013, Enschede, Netherlands.