Integration of Physical Reliability Knowledge into the Design of VLSI-Circuits

D.C.L. van Geest, R.H. Hoeksma, A.C. Brombacher, O.E. Herrmann

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    Abstract

    A systematic approach for modeling failure mechanisms on the circuit level and for using these models for optimization of both reliability and functionability is presented. Since optimization is done using a CAD system, it is possible to carry out such an optimization in a very early stage of the design process. The stress factors of the failure mechanisms are calculated using a circuit simulator and the effect of internal and external tolerances is incorporated in the simulation. From these results the sensitivity of failure behavior for so-called designable parameters on circuit level is determined. This information is used to optimize the design toward minimum occurrence of failures. For functional demands the same methodology is used
    Original languageEnglish
    Title of host publication31st Annual Proceedings Reliability Physics 1993
    Subtitle of host publicationAtlanta, Georgia March 23, 24, 25, 1993
    PublisherIEEE
    Pages81-86
    Number of pages6
    ISBN (Print)0-7803-0782-8, 0-7803-0783-6
    DOIs
    Publication statusPublished - 1 Sep 1993
    Event31st Annual IEEE International Reliability Physics Symposium, IRPS 1993 - Atlanta, United States
    Duration: 23 Mar 199325 Mar 1993
    Conference number: 31

    Conference

    Conference31st Annual IEEE International Reliability Physics Symposium, IRPS 1993
    Abbreviated titleIRPS
    CountryUnited States
    CityAtlanta
    Period23/03/9325/03/93

    Keywords

    • METIS-113106
    • IR-16221

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