Integration of the Scan-test Method into an Architecture Specific Core-test Approach

C. Feige, C. Wouters, H. ten Pierick, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop (ETW)
    Place of PublicationBarcelona, Spain
    Pages241-245
    Number of pages5
    Publication statusPublished - 27 May 1998

    Keywords

    • METIS-112983

    Cite this

    Feige, C., Wouters, C., ten Pierick, H., Tangelder, R. J. W. T., & Kerkhoff, H. G. (1998). Integration of the Scan-test Method into an Architecture Specific Core-test Approach. In Proceedings of the IEEE European Test Workshop (ETW) (pp. 241-245). Barcelona, Spain.