Integration of the Scan-test Method into an Architecture Specific Core-test Approach

C. Feige, C. Wouters, H. ten Pierick, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop (ETW)
    Place of PublicationBarcelona, Spain
    Number of pages5
    Publication statusPublished - 27 May 1998


    • METIS-112983

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