Integration of the Scan-test Method into an Architecture Specific Core-test Approach

C. Feige, C. Wouters, H. ten Pierick, R.J.W.T. Tangelder, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE European Test Workshop (ETW)
Place of Publication	Barcelona, Spain
Pages	241-245
Number of pages	5
Publication status	Published - 27 May 1998

Keywords

@inproceedings{76ab705f3cd44a278c7310d20892a291,

title = "Integration of the Scan-test Method into an Architecture Specific Core-test Approach",

keywords = "METIS-112983",

author = "C. Feige and C. Wouters and {ten Pierick}, H. and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",

year = "1998",

month = may,

day = "27",

language = "Undefined",

pages = "241--245",

booktitle = "Proceedings of the IEEE European Test Workshop (ETW)",

}

TY - GEN

T1 - Integration of the Scan-test Method into an Architecture Specific Core-test Approach

AU - Feige, C.

AU - Wouters, C.

AU - ten Pierick, H.

AU - Tangelder, R.J.W.T.

AU - Kerkhoff, Hans G.

PY - 1998/5/27

Y1 - 1998/5/27

KW - METIS-112983

M3 - Conference contribution

SP - 241

EP - 245

BT - Proceedings of the IEEE European Test Workshop (ETW)

CY - Barcelona, Spain

ER -