Integration of the Scan-test Method into an Architecture Specific Core-test Approach

C. Feige, J. ten Pierick, C. Wouters, R.J.W.T. Tangelder, Hans G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined
Pages (from-to)	125-132
Number of pages	8
Journal	Journal of electronic testing
Volume	1999
Issue number	1/2
Publication status	Published - 1999

Keywords

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title = "Integration of the Scan-test Method into an Architecture Specific Core-test Approach",

keywords = "METIS-111661",

author = "C. Feige and {ten Pierick}, J. and C. Wouters and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",

year = "1999",

language = "Undefined",

volume = "1999",

pages = "125--132",

journal = "Journal of electronic testing",

issn = "0923-8174",

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TY - JOUR

T1 - Integration of the Scan-test Method into an Architecture Specific Core-test Approach

AU - Feige, C.

AU - ten Pierick, J.

AU - Wouters, C.

AU - Tangelder, R.J.W.T.

AU - Kerkhoff, Hans G.

PY - 1999

Y1 - 1999

KW - METIS-111661

M3 - Article

VL - 1999

SP - 125

EP - 132

JO - Journal of electronic testing

JF - Journal of electronic testing

SN - 0923-8174

IS - 1/2

ER -