Integration of the Scan-test Method into an Architecture Specific Core-test Approach

C. Feige, J. ten Pierick, C. Wouters, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Contribution to journalArticleAcademicpeer-review

    10 Citations (Scopus)
    Original languageUndefined
    Pages (from-to)125-132
    Number of pages8
    JournalJournal of electronic testing
    Issue number1/2
    Publication statusPublished - 1999


    • METIS-111661

    Cite this