Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors

M. T. Do, N. Gauquelin, M. D. Nguyen, F. Blom, J. Verbeeck, G. Koster*, E. P. Houwman*, G. Rijnders

*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

7 Citations (Scopus)
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