Interface instabilities in polymer light emitting diodes due to annealing

F.J.J. Janssen, J.M. Sturm, A.W. Denier van der Gon, L.J. van IJzendoorn (Corresponding Author), M. Kemerink, H.F.M. Schoo, M.J.A. de Voigt, H.H. Brongersma

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

In polymer light emitting diodes (PLEDS) with an (ITO/PPV/Ca) structure we observed a significant reduction of both the current and the light output at constant voltage after heat treatment for only 30 min at 65 °C. Electroluminescence spectroscopy experiments showed that the shape as well as the amplitude of the spectra were changed.

The reduction of current and light output was investigated by measuring I–V and E–V (current–voltage and brightness–voltage) characteristics of PLEDs, I–V characteristics of single carrier devices, and by performing low energy ion scattering and X-ray photoelectron spectroscopy experiments on the Ca/PPV interface.

It was concluded that the current and light output reduction could be ascribed to the degradation of the Ca/PPV and the ITO/PPV interfaces. The degradation of the ITO/PPV interface resulted in a reduction of the zero field hole mobility and a small increase of the field dependence of the mobility. The degradation of the Ca/PPV interface, probably by diffusion of calcium into the PPV, resulted in carrier traps and quenching sites, which influenced the field dependent electron mobility.
Original languageEnglish
Pages (from-to)209-218
JournalOrganic electronics
Volume4
Issue number4
DOIs
Publication statusPublished - Dec 2003
Externally publishedYes

Keywords

  • conjugated polymers
  • light emitting devices
  • annealing
  • interface
  • stability

Cite this

Janssen, F. J. J., Sturm, J. M., Denier van der Gon, A. W., van IJzendoorn, L. J., Kemerink, M., Schoo, H. F. M., ... Brongersma, H. H. (2003). Interface instabilities in polymer light emitting diodes due to annealing. Organic electronics, 4(4), 209-218. https://doi.org/10.1016/S1566-1199(03)00017-X
Janssen, F.J.J. ; Sturm, J.M. ; Denier van der Gon, A.W. ; van IJzendoorn, L.J. ; Kemerink, M. ; Schoo, H.F.M. ; de Voigt, M.J.A. ; Brongersma, H.H. / Interface instabilities in polymer light emitting diodes due to annealing. In: Organic electronics. 2003 ; Vol. 4, No. 4. pp. 209-218.
@article{37e6d9c3e7b94b4f9fa5b62e63189a65,
title = "Interface instabilities in polymer light emitting diodes due to annealing",
abstract = "In polymer light emitting diodes (PLEDS) with an (ITO/PPV/Ca) structure we observed a significant reduction of both the current and the light output at constant voltage after heat treatment for only 30 min at 65 °C. Electroluminescence spectroscopy experiments showed that the shape as well as the amplitude of the spectra were changed.The reduction of current and light output was investigated by measuring I–V and E–V (current–voltage and brightness–voltage) characteristics of PLEDs, I–V characteristics of single carrier devices, and by performing low energy ion scattering and X-ray photoelectron spectroscopy experiments on the Ca/PPV interface.It was concluded that the current and light output reduction could be ascribed to the degradation of the Ca/PPV and the ITO/PPV interfaces. The degradation of the ITO/PPV interface resulted in a reduction of the zero field hole mobility and a small increase of the field dependence of the mobility. The degradation of the Ca/PPV interface, probably by diffusion of calcium into the PPV, resulted in carrier traps and quenching sites, which influenced the field dependent electron mobility.",
keywords = "conjugated polymers, light emitting devices, annealing, interface, stability",
author = "F.J.J. Janssen and J.M. Sturm and {Denier van der Gon}, A.W. and {van IJzendoorn}, L.J. and M. Kemerink and H.F.M. Schoo and {de Voigt}, M.J.A. and H.H. Brongersma",
year = "2003",
month = "12",
doi = "10.1016/S1566-1199(03)00017-X",
language = "English",
volume = "4",
pages = "209--218",
journal = "Organic electronics",
issn = "1566-1199",
publisher = "Elsevier",
number = "4",

}

Janssen, FJJ, Sturm, JM, Denier van der Gon, AW, van IJzendoorn, LJ, Kemerink, M, Schoo, HFM, de Voigt, MJA & Brongersma, HH 2003, 'Interface instabilities in polymer light emitting diodes due to annealing' Organic electronics, vol. 4, no. 4, pp. 209-218. https://doi.org/10.1016/S1566-1199(03)00017-X

Interface instabilities in polymer light emitting diodes due to annealing. / Janssen, F.J.J.; Sturm, J.M.; Denier van der Gon, A.W.; van IJzendoorn, L.J. (Corresponding Author); Kemerink, M.; Schoo, H.F.M.; de Voigt, M.J.A.; Brongersma, H.H.

In: Organic electronics, Vol. 4, No. 4, 12.2003, p. 209-218.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Interface instabilities in polymer light emitting diodes due to annealing

AU - Janssen, F.J.J.

AU - Sturm, J.M.

AU - Denier van der Gon, A.W.

AU - van IJzendoorn, L.J.

AU - Kemerink, M.

AU - Schoo, H.F.M.

AU - de Voigt, M.J.A.

AU - Brongersma, H.H.

PY - 2003/12

Y1 - 2003/12

N2 - In polymer light emitting diodes (PLEDS) with an (ITO/PPV/Ca) structure we observed a significant reduction of both the current and the light output at constant voltage after heat treatment for only 30 min at 65 °C. Electroluminescence spectroscopy experiments showed that the shape as well as the amplitude of the spectra were changed.The reduction of current and light output was investigated by measuring I–V and E–V (current–voltage and brightness–voltage) characteristics of PLEDs, I–V characteristics of single carrier devices, and by performing low energy ion scattering and X-ray photoelectron spectroscopy experiments on the Ca/PPV interface.It was concluded that the current and light output reduction could be ascribed to the degradation of the Ca/PPV and the ITO/PPV interfaces. The degradation of the ITO/PPV interface resulted in a reduction of the zero field hole mobility and a small increase of the field dependence of the mobility. The degradation of the Ca/PPV interface, probably by diffusion of calcium into the PPV, resulted in carrier traps and quenching sites, which influenced the field dependent electron mobility.

AB - In polymer light emitting diodes (PLEDS) with an (ITO/PPV/Ca) structure we observed a significant reduction of both the current and the light output at constant voltage after heat treatment for only 30 min at 65 °C. Electroluminescence spectroscopy experiments showed that the shape as well as the amplitude of the spectra were changed.The reduction of current and light output was investigated by measuring I–V and E–V (current–voltage and brightness–voltage) characteristics of PLEDs, I–V characteristics of single carrier devices, and by performing low energy ion scattering and X-ray photoelectron spectroscopy experiments on the Ca/PPV interface.It was concluded that the current and light output reduction could be ascribed to the degradation of the Ca/PPV and the ITO/PPV interfaces. The degradation of the ITO/PPV interface resulted in a reduction of the zero field hole mobility and a small increase of the field dependence of the mobility. The degradation of the Ca/PPV interface, probably by diffusion of calcium into the PPV, resulted in carrier traps and quenching sites, which influenced the field dependent electron mobility.

KW - conjugated polymers

KW - light emitting devices

KW - annealing

KW - interface

KW - stability

U2 - 10.1016/S1566-1199(03)00017-X

DO - 10.1016/S1566-1199(03)00017-X

M3 - Article

VL - 4

SP - 209

EP - 218

JO - Organic electronics

JF - Organic electronics

SN - 1566-1199

IS - 4

ER -

Janssen FJJ, Sturm JM, Denier van der Gon AW, van IJzendoorn LJ, Kemerink M, Schoo HFM et al. Interface instabilities in polymer light emitting diodes due to annealing. Organic electronics. 2003 Dec;4(4):209-218. https://doi.org/10.1016/S1566-1199(03)00017-X