Interlayer thermodynamics in nanoscale layered structures for reflection of EUV radiation

Jeroen Bosgra

doi:10.3990/1.9789461917942

Interlayer thermodynamics in nanoscale layered structures for reflection of EUV radiation

Jeroen Bosgra

Research output: Thesis › PhD Thesis - Research external, graduation UT

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Abstract

The research described in this thesis is on Mo/Si based multilayer mirror structures. Two important topics in this field are increase of reflection and improvement of thermal stability. The "standard" Mo/Si multilayer structure in theory can reflect about 75% of the incoming 13.5 nm radiation. However, interlayer formation during deposition and roughness of the interfaces reduce the reflection of deposited multilayer structures. To further improve the multilayer structures, a better understanding of interdiffusion effects at the interfaces is required.

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	University of Twente
Supervisors/Advisors	Bijkerk, Fred, Supervisor Yakshin, Andrey, Co-Supervisor
Award date	4 Jul 2013
Place of Publication	Enschede
Publisher	University of Twente
Print ISBNs	978-94-6191-794-2
DOIs	https://doi.org/10.3990/1.9789461917942
Publication status	Published - 4 Jul 2013

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@phdthesis{43fb3296ff9f4dad906f8e71dce4a1a5,

title = "Interlayer thermodynamics in nanoscale layered structures for reflection of EUV radiation",

abstract = "The research described in this thesis is on Mo/Si based multilayer mirror structures. Two important topics in this field are increase of reflection and improvement of thermal stability. The {"}standard{"} Mo/Si multilayer structure in theory can reflect about 75% of the incoming 13.5 nm radiation. However, interlayer formation during deposition and roughness of the interfaces reduce the reflection of deposited multilayer structures. To further improve the multilayer structures, a better understanding of interdiffusion effects at the interfaces is required.",

author = "Jeroen Bosgra",

note = "promotiepremie 100% LPNO",

year = "2013",

month = jul,

day = "4",

doi = "10.3990/1.9789461917942",

language = "English",

isbn = "978-94-6191-794-2",

publisher = "University of Twente",

address = "Netherlands",

type = "PhD Thesis - Research external, graduation UT",

school = "University of Twente",

}

TY - THES

T1 - Interlayer thermodynamics in nanoscale layered structures for reflection of EUV radiation

AU - Bosgra, Jeroen

N1 - promotiepremie 100% LPNO

PY - 2013/7/4

Y1 - 2013/7/4

N2 - The research described in this thesis is on Mo/Si based multilayer mirror structures. Two important topics in this field are increase of reflection and improvement of thermal stability. The "standard" Mo/Si multilayer structure in theory can reflect about 75% of the incoming 13.5 nm radiation. However, interlayer formation during deposition and roughness of the interfaces reduce the reflection of deposited multilayer structures. To further improve the multilayer structures, a better understanding of interdiffusion effects at the interfaces is required.

AB - The research described in this thesis is on Mo/Si based multilayer mirror structures. Two important topics in this field are increase of reflection and improvement of thermal stability. The "standard" Mo/Si multilayer structure in theory can reflect about 75% of the incoming 13.5 nm radiation. However, interlayer formation during deposition and roughness of the interfaces reduce the reflection of deposited multilayer structures. To further improve the multilayer structures, a better understanding of interdiffusion effects at the interfaces is required.

U2 - 10.3990/1.9789461917942

DO - 10.3990/1.9789461917942

M3 - PhD Thesis - Research external, graduation UT

SN - 978-94-6191-794-2

PB - University of Twente

CY - Enschede

ER -

Interlayer thermodynamics in nanoscale layered structures for reflection of EUV radiation

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