Abstract
The research described in this thesis is on Mo/Si based multilayer mirror
structures. Two important topics in this field are increase of reflection and
improvement of thermal stability. The "standard" Mo/Si multilayer structure
in theory can reflect about 75% of the incoming 13.5 nm radiation.
However, interlayer formation during deposition and roughness of the interfaces
reduce the reflection of deposited multilayer structures. To further improve the multilayer structures, a better understanding of interdiffusion effects at the interfaces is required.
Original language | English |
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Awarding Institution |
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Supervisors/Advisors |
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Award date | 4 Jul 2013 |
Place of Publication | Enschede |
Publisher | |
Print ISBNs | 9789461917942 |
Publication status | Published - 4 Jul 2013 |
Keywords
- IR-89206
- METIS-299380