Intermittent Resistance Fault Detection at Board Level

Hassan Ebrahimi, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Interconnection reliability issues threat the dependability of highly dependable systems. One of the most challenging interconnection-induced reliability threats is intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the board level has been investigated by introducing a new digital IRF monitor. This monitor has been validated by using hardware-based fault injection. Two widely used on-board transmission protocols -UART and SPI -have been used as case studies. In addition, one fault management framework -based on the IJTAG standard -has been implemented to collect and characterize information from the monitors. The experimental results show that the proposed monitor is effective in detecting IRFs at the board level.
Original languageEnglish
Title of host publication2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
ISBN (Electronic)978-1-5386-5754-6
Publication statusPublished - 2018
Event21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2018 - NH Budapest City Hotel, Budapest, Hungary
Duration: 25 Apr 201827 Apr 2018
Conference number: 21
https://ddecs2018.itk.ppke.hu/

Conference

Conference21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2018
Abbreviated titleDDECS 2018
CountryHungary
CityBudapest
Period25/04/1827/04/18
Internet address

Fingerprint

Fault detection
Hardware

Cite this

Ebrahimi, H., & Kerkhoff, H. G. (2018). Intermittent Resistance Fault Detection at Board Level. In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Ebrahimi, Hassan ; Kerkhoff, Hans G. / Intermittent Resistance Fault Detection at Board Level. 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) . 2018.
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title = "Intermittent Resistance Fault Detection at Board Level",
abstract = "Interconnection reliability issues threat the dependability of highly dependable systems. One of the most challenging interconnection-induced reliability threats is intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the board level has been investigated by introducing a new digital IRF monitor. This monitor has been validated by using hardware-based fault injection. Two widely used on-board transmission protocols -UART and SPI -have been used as case studies. In addition, one fault management framework -based on the IJTAG standard -has been implemented to collect and characterize information from the monitors. The experimental results show that the proposed monitor is effective in detecting IRFs at the board level.",
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language = "English",
isbn = "978-1-5386-5755-3",
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Ebrahimi, H & Kerkhoff, HG 2018, Intermittent Resistance Fault Detection at Board Level. in 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) . 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2018, Budapest, Hungary, 25/04/18.

Intermittent Resistance Fault Detection at Board Level. / Ebrahimi, Hassan ; Kerkhoff, Hans G.

2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) . 2018.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

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AU - Ebrahimi, Hassan

AU - Kerkhoff, Hans G.

PY - 2018

Y1 - 2018

N2 - Interconnection reliability issues threat the dependability of highly dependable systems. One of the most challenging interconnection-induced reliability threats is intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the board level has been investigated by introducing a new digital IRF monitor. This monitor has been validated by using hardware-based fault injection. Two widely used on-board transmission protocols -UART and SPI -have been used as case studies. In addition, one fault management framework -based on the IJTAG standard -has been implemented to collect and characterize information from the monitors. The experimental results show that the proposed monitor is effective in detecting IRFs at the board level.

AB - Interconnection reliability issues threat the dependability of highly dependable systems. One of the most challenging interconnection-induced reliability threats is intermittent resistive faults (IRFs). They may occur randomly in time, duration and amplitude in every interconnection. The occurrence rate can vary from a few nanoseconds to months. As a result, evoking and detecting such faults is a major challenge. In this paper, IRF detection at the board level has been investigated by introducing a new digital IRF monitor. This monitor has been validated by using hardware-based fault injection. Two widely used on-board transmission protocols -UART and SPI -have been used as case studies. In addition, one fault management framework -based on the IJTAG standard -has been implemented to collect and characterize information from the monitors. The experimental results show that the proposed monitor is effective in detecting IRFs at the board level.

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Ebrahimi H, Kerkhoff HG. Intermittent Resistance Fault Detection at Board Level. In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) . 2018