Intermittent resistive faults in digital cmos circuits

Hans G. Kerkhoff, Hassan Ebrahimi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    6 Citations (Scopus)
    150 Downloads (Pure)

    Abstract

    A major threat in extremely dependable high-end process node integrated systems in e.g. Avionics are no failures found (NFF). One category of NFFs is the intermittent resistive fault, often originating from bad (e.g. Via or TSV-based) interconnections. This paper will show the impact of these faults on the behavior of a digital CMOS circuit via simulation. As the occurrence rate of this kind of defects can take e.g. One month, while the duration of the defect can be as short as 50 nanoseconds, to evoke and detect these faults is a huge scientific challenge. An on-chip data logging system with time stamp and stored environmental conditions, along with the detection, will drastically improve the task of maintenance of avionics and reduce the current high debugging costs.
    Original languageUndefined
    Title of host publicationIEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015
    Place of PublicationUSA
    PublisherIEEE Circuits & Systems Society
    Pages211-216
    Number of pages6
    ISBN (Print)978-1-4799-6779-7
    DOIs
    Publication statusPublished - 24 Apr 2015
    Event18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015 - Palace Hotel, Belgrade, Serbia
    Duration: 22 Apr 201524 Apr 2015
    Conference number: 18
    http://www.ddecs.org/
    http://www.ddecs2015.org/

    Publication series

    Name
    PublisherIEEE Circuits & Systems Society

    Conference

    Conference18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015
    Abbreviated titleDDECS
    CountrySerbia
    CityBelgrade
    Period22/04/1524/04/15
    Internet address

    Keywords

    • EC Grant Agreement nr.: FP7/619871
    • CAES-TDT: Testable Design and Test
    • EWI-26209
    • Dependability
    • METIS-312693
    • No Faults Found
    • Reliability
    • IR-96802
    • Evoking & Detection of Intermittent Faults
    • Intermittent Resistive Faults

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