International Mixed-Signal Testing Workshop

R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Book/ReportBookAcademic

    Original languageUndefined
    Place of PublicationEnschede, the Netherlands
    PublisherIEEE Computer Society Test Technology Technical Committee
    Number of pages303
    Publication statusPublished - 1998

    Keywords

    • METIS-112443

    Cite this

    Tangelder, R. J. W. T., & Kerkhoff, H. G. (1998). International Mixed-Signal Testing Workshop. Enschede, the Netherlands: IEEE Computer Society Test Technology Technical Committee.