Abstract
We have investigated the static and dynamic properties of long YBa2Cu3O7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions
Original language | English |
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Article number | 177003 |
Journal | Physical review letters |
Volume | 104 |
DOIs | |
Publication status | Published - 2010 |