Interplay between static and dynamic properties of semifluxons in YBa2Cu3O7-δ 0-π Josephson junctions

K. Cedergren, J.R. Kirtley, T. Bouch, G. Rotoli, A. Troeman, H. Hilgenkamp, F. Tafuri, F. Lombardi

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)

Abstract

We have investigated the static and dynamic properties of long YBa2Cu3O7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions
Original languageEnglish
Article number177003
JournalPhysical review letters
Volume104
DOIs
Publication statusPublished - 2010

Fingerprint

Dive into the research topics of 'Interplay between static and dynamic properties of semifluxons in YBa2Cu3O7-δ 0-π Josephson junctions'. Together they form a unique fingerprint.

Cite this