Interplay between static and dynamic properties of semifluxons in YBa2Cu3O7-δ 0-π Josephson junctions

K. Cedergren; J.R. Kirtley; T. Bouch; G. Rotoli; A. Troeman; H. Hilgenkamp; F. Tafuri; F. Lombardi

doi:10.1103/PhysRevLett.104.177003

Interplay between static and dynamic properties of semifluxons in YBa₂Cu₃O_7-δ 0-π Josephson junctions

K. Cedergren
, J.R. Kirtley
, T. Bouch
, G. Rotoli
, A. Troeman
, H. Hilgenkamp
, F. Tafuri
, F. Lombardi

Interfaces and Correlated Electron Systems

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

We have investigated the static and dynamic properties of long YBa₂Cu₃O_7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions

Original language	English
Article number	177003
Journal	Physical review letters
Volume	104
DOIs	https://doi.org/10.1103/PhysRevLett.104.177003
Publication status	Published - 2010

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10.1103/PhysRevLett.104.177003

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title = "Interplay between static and dynamic properties of semifluxons in YBa2Cu3O7-δ 0-π Josephson junctions",

abstract = "We have investigated the static and dynamic properties of long YBa2Cu3O7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions",

author = "K. Cedergren and J.R. Kirtley and T. Bouch and G. Rotoli and A. Troeman and H. Hilgenkamp and F. Tafuri and F. Lombardi",

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AU - Cedergren, K.

AU - Kirtley, J.R.

AU - Bouch, T.

AU - Rotoli, G.

AU - Troeman, A.

AU - Hilgenkamp, H.

AU - Tafuri, F.

AU - Lombardi, F.

PY - 2010

Y1 - 2010

N2 - We have investigated the static and dynamic properties of long YBa2Cu3O7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions

AB - We have investigated the static and dynamic properties of long YBa2Cu3O7−δ 0−π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0−π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0−π Josephson junctions

U2 - 10.1103/PhysRevLett.104.177003

DO - 10.1103/PhysRevLett.104.177003

M3 - Article

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JO - Physical review letters

JF - Physical review letters

M1 - 177003

ER -

Interplay between static and dynamic properties of semifluxons in YBa2Cu3O7-δ 0-π Josephson junctions

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Interplay between static and dynamic properties of semifluxons in YBa₂Cu₃O_7-δ 0-π Josephson junctions