Interplay of annealing temperature and doping in hole selective rear contacts based on silicon-rich silicon-carbide thin films

G. Nogay*, J. Stuckelberger, P. Wyss, E. Rucavado, C. Allebé, T. Koida, M. Morales-Masis, M. Despeisse, F.-J. Haug, P. Löper, C. Ballif

*Corresponding author for this work

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