Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 28 Sep 2014
Event21st International Workshop on Oxide Electronics, iWOE 2014 - Bolton Landing, United States
Duration: 28 Sep 20141 Oct 2014
Conference number: 21

Conference

Conference21st International Workshop on Oxide Electronics, iWOE 2014
Abbreviated titleiWOE
CountryUnited States
CityBolton Landing
Period28/09/141/10/14

Keywords

  • METIS-306831

Cite this

Houwman, E. P. (2014). Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt. -. Poster session presented at 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, United States.