Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 28 Sep 2014
Event21st International Workshop on Oxide Electronics, iWOE 2014 - Bolton Landing, United States
Duration: 28 Sep 20141 Oct 2014
Conference number: 21

Conference

Conference21st International Workshop on Oxide Electronics, iWOE 2014
Abbreviated titleiWOE
CountryUnited States
CityBolton Landing
Period28/09/141/10/14

Keywords

  • METIS-306831

Cite this

Houwman, E. P. (2014). Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt. -. Poster session presented at 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, United States.
Houwman, Evert Pieter. / Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt. Poster session presented at 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, United States.
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title = "Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt",
keywords = "METIS-306831",
author = "Houwman, {Evert Pieter}",
year = "2014",
month = "9",
day = "28",
language = "Undefined",
pages = "--",
note = "null ; Conference date: 28-09-2014 Through 01-10-2014",

}

Houwman, EP 2014, 'Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt' 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, United States, 28/09/14 - 1/10/14, pp. -.

Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt. / Houwman, Evert Pieter.

2014. - Poster session presented at 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, United States.

Research output: Contribution to conferencePoster

TY - CONF

T1 - Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt

AU - Houwman, Evert Pieter

PY - 2014/9/28

Y1 - 2014/9/28

KW - METIS-306831

M3 - Poster

SP - -

ER -

Houwman EP. Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt. 2014. Poster session presented at 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, United States.