Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr0.45Ti0.55O3 thin films on silicon in relation to grain tilt

Evert Pieter Houwman, Duc Minh Nguyen, Jan M. Dekkers, Augustinus J.H.M. Rijnders

Research output: Contribution to journal › Article › Academic › peer-review

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