Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt

Evert Pieter Houwman

Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt

Inorganic Materials Science

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 28 Sept 2014
Event	21st International Workshop on Oxide Electronics, iWOE 2014 - Bolton Landing, United States Duration: 28 Sept 2014 → 1 Oct 2014 Conference number: 21

Conference

Conference	21st International Workshop on Oxide Electronics, iWOE 2014
Abbreviated title	iWOE
Country/Territory	United States
City	Bolton Landing
Period	28/09/14 → 1/10/14

Keywords

METIS-306831

Cite this

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title = "Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt",

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author = "Houwman, \{Evert Pieter\}",

year = "2014",

month = sep,

day = "28",

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note = "21st International Workshop on Oxide Electronics, iWOE 2014 ; Conference date: 28-09-2014 Through 01-10-2014",

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Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt. / Houwman, Evert Pieter.
2014. - Poster session presented at 21st International Workshop on Oxide Electronics, iWOE 2014, Bolton Landing, New York, United States.

Research output: Contribution to conference › Poster › Other research output

TY - CONF

T1 - Intrinsic Stability of Ferroelectric and Piezoelectric Properties of Epitaxial PbZr0.45Ti0.55O3 Thin Films on Silicon in Relation to Grain Tilt

AU - Houwman, Evert Pieter

N1 - Conference code: 21

PY - 2014/9/28

Y1 - 2014/9/28

KW - METIS-306831

M3 - Poster

SP - -

T2 - 21st International Workshop on Oxide Electronics, iWOE 2014

Y2 - 28 September 2014 through 1 October 2014

ER -