Investigating Recording Patterns Using Magnetic Force Microscopy

J.P.J. (Hans) Groenland, G.J.P. (Peter) van Engelen, Jan P.C. Bernards, Hugo A.J. Cramer

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    Abstract

    The magnetic force microscope is a valuable tool for the qualitative analysis of local phenomena in magnetic recording media. To study the possibilities for a more quantitative analysis, the MFM results have been compared with recording results. It is shown that such analysis is hampered by the nonlinear transfer characteristic and by the masking of local high-definition details due to the application of an auxiliary electrostatic field in the current instrument.
    Original languageEnglish
    Pages (from-to)327-329
    Number of pages3
    JournalJournal of magnetism and magnetic materials
    Volume120
    Issue number120
    DOIs
    Publication statusPublished - 1993

    Keywords

    • METIS-112380
    • EWI-5432
    • IR-15501
    • SMI-REC: RECORDING
    • SMI-TST: From 2006 in EWI-TST

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