Investigating Recording Patterns Using Magnetic Force Microscopy

J.P.J. (Hans) Groenland; G.J.P. (Peter) van Engelen; Jan P.C. Bernards; Hugo A.J. Cramer

doi:10.1016/0304-8853(93)91353-9

Investigating Recording Patterns Using Magnetic Force Microscopy

J.P.J. (Hans) Groenland, G.J.P. (Peter) van Engelen, Jan P.C. Bernards, Hugo A.J. Cramer

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

The magnetic force microscope is a valuable tool for the qualitative analysis of local phenomena in magnetic recording media. To study the possibilities for a more quantitative analysis, the MFM results have been compared with recording results. It is shown that such analysis is hampered by the nonlinear transfer characteristic and by the masking of local high-definition details due to the application of an auxiliary electrostatic field in the current instrument.

Original language	English
Pages (from-to)	327-329
Number of pages	3
Journal	Journal of magnetism and magnetic materials
Volume	120
Issue number	120
DOIs	https://doi.org/10.1016/0304-8853(93)91353-9
Publication status	Published - 1993

Keywords

METIS-112380
EWI-5432
IR-15501
SMI-REC: RECORDING
SMI-TST: From 2006 in EWI-TST

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10.1016/0304-8853(93)91353-9

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title = "Investigating Recording Patterns Using Magnetic Force Microscopy",

abstract = "The magnetic force microscope is a valuable tool for the qualitative analysis of local phenomena in magnetic recording media. To study the possibilities for a more quantitative analysis, the MFM results have been compared with recording results. It is shown that such analysis is hampered by the nonlinear transfer characteristic and by the masking of local high-definition details due to the application of an auxiliary electrostatic field in the current instrument.",

keywords = "METIS-112380, EWI-5432, IR-15501, SMI-REC: RECORDING, SMI-TST: From 2006 in EWI-TST",

author = "Groenland, {J.P.J. (Hans)} and {van Engelen}, {G.J.P. (Peter)} and Bernards, {Jan P.C.} and Cramer, {Hugo A.J.}",

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AU - Groenland, J.P.J. (Hans)

AU - van Engelen, G.J.P. (Peter)

AU - Bernards, Jan P.C.

AU - Cramer, Hugo A.J.

N1 - Imported from SMI Reference manager

PY - 1993

Y1 - 1993

N2 - The magnetic force microscope is a valuable tool for the qualitative analysis of local phenomena in magnetic recording media. To study the possibilities for a more quantitative analysis, the MFM results have been compared with recording results. It is shown that such analysis is hampered by the nonlinear transfer characteristic and by the masking of local high-definition details due to the application of an auxiliary electrostatic field in the current instrument.

AB - The magnetic force microscope is a valuable tool for the qualitative analysis of local phenomena in magnetic recording media. To study the possibilities for a more quantitative analysis, the MFM results have been compared with recording results. It is shown that such analysis is hampered by the nonlinear transfer characteristic and by the masking of local high-definition details due to the application of an auxiliary electrostatic field in the current instrument.

KW - METIS-112380

KW - EWI-5432

KW - IR-15501

KW - SMI-REC: RECORDING

KW - SMI-TST: From 2006 in EWI-TST

U2 - 10.1016/0304-8853(93)91353-9

DO - 10.1016/0304-8853(93)91353-9

M3 - Article

VL - 120

SP - 327

EP - 329

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

SN - 0304-8853

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