Investigation of Intermittent Resistive Faults in Digital CMOS Circuits

Hans G. Kerkhoff, Hassan Ebrahimi

    Research output: Contribution to journalArticleAcademicpeer-review

    3 Citations (Scopus)
    57 Downloads (Pure)

    Abstract

    No fault found (NFF) is a major threat in extremely dependable high-end process node integrated systems, in e.g., avionics. One category of NFFs is the intermittent resistive fault (IRF), often originating from bad (e.g., via- or TSV-based) interconnections. This paper will show the impact of these faults on the behavior of a digital CMOS circuit via simulation. As the occurrence rate of this kind of defects can take e.g., one month, while the duration of the defect can be as short as 50ns, thus to evoke and detect these faults is a huge scientific challenge. Two methods to detect short pulses induced by IRFs are proposed. To improve the task of maintenance of avionics and reduce the current high debugging costs, an on-chip data logging system with time stamp and stored environmental conditions is introduced. Finally, a hardware implementation of an IRF generator is presented. Read More: http://www.worldscientific.com/doi/10.1142/S0218126616400235
    Original languageEnglish
    Article number1640023
    Number of pages17
    JournalJournal of circuits, systems and computers
    Volume25
    Issue number03
    DOIs
    Publication statusPublished - Mar 2016

    Fingerprint

    Avionics
    Defects
    Networks (circuits)
    Hardware
    Costs

    Keywords

    • No Faults Found
    • Reliability
    • EWI-27201
    • EC Grant Agreement nr.: FP7/619871
    • Intermittent Resistive Faults
    • METIS-321659
    • IR-103180
    • Evoking & Detection of Intermittent Faults
    • Dependability
    • CR-B.4.5

    Cite this

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    abstract = "No fault found (NFF) is a major threat in extremely dependable high-end process node integrated systems, in e.g., avionics. One category of NFFs is the intermittent resistive fault (IRF), often originating from bad (e.g., via- or TSV-based) interconnections. This paper will show the impact of these faults on the behavior of a digital CMOS circuit via simulation. As the occurrence rate of this kind of defects can take e.g., one month, while the duration of the defect can be as short as 50ns, thus to evoke and detect these faults is a huge scientific challenge. Two methods to detect short pulses induced by IRFs are proposed. To improve the task of maintenance of avionics and reduce the current high debugging costs, an on-chip data logging system with time stamp and stored environmental conditions is introduced. Finally, a hardware implementation of an IRF generator is presented. Read More: http://www.worldscientific.com/doi/10.1142/S0218126616400235",
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    Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. / Kerkhoff, Hans G.; Ebrahimi, Hassan.

    In: Journal of circuits, systems and computers, Vol. 25, No. 03, 1640023, 03.2016.

    Research output: Contribution to journalArticleAcademicpeer-review

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    AU - Ebrahimi, Hassan

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