Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proc. of the 11th International Materials Conference (ICMC)
Place of Publication	Columbus, Ohio
Pages	1463-1470
Number of pages	8
Publication status	Published - 2 May 1997

Keywords

@inproceedings{4fbb3a43ebb54daebdebb62d6832a156,

title = "Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains",

keywords = "METIS-130433",

author = "{ten Haken}, Bernard and A. Godeke and {ten Kate}, {Herman H.J.}",

year = "1997",

month = may,

day = "2",

language = "Undefined",

isbn = "0-306-45374-6",

pages = "1463--1470",

booktitle = "Proc. of the 11th International Materials Conference (ICMC)",

}

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains

AU - ten Haken, Bernard

AU - Godeke, A.

AU - ten Kate, Herman H.J.

PY - 1997/5/2

Y1 - 1997/5/2

KW - METIS-130433

M3 - Conference contribution

SN - 0-306-45374-6

SP - 1463

EP - 1470

BT - Proc. of the 11th International Materials Conference (ICMC)

CY - Columbus, Ohio

ER -