| Original language | Undefined |
|---|---|
| Title of host publication | Proc. of the 11th International Materials Conference (ICMC) |
| Place of Publication | Columbus, Ohio |
| Pages | 1463-1470 |
| Number of pages | 8 |
| Publication status | Published - 2 May 1997 |
Keywords
- METIS-130433
Cite this
ten Haken, B., Godeke, A., & ten Kate, H. H. J. (1997). Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. In Proc. of the 11th International Materials Conference (ICMC) (pp. 1463-1470). Columbus, Ohio.
@inproceedings{4fbb3a43ebb54daebdebb62d6832a156,
title = "Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains",
keywords = "METIS-130433",
author = "{ten Haken}, Bernard and A. Godeke and {ten Kate}, {Herman H.J.}",
year = "1997",
month = "5",
day = "2",
language = "Undefined",
isbn = "0-306-45374-6",
pages = "1463--1470",
booktitle = "Proc. of the 11th International Materials Conference (ICMC)",
}
ten Haken, B, Godeke, A & ten Kate, HHJ 1997, Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. in Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio, pp. 1463-1470.
Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. / ten Haken, Bernard; Godeke, A.; ten Kate, Herman H.J.
Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio, 1997. p. 1463-1470.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
TY - GEN
T1 - Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains
AU - ten Haken, Bernard
AU - Godeke, A.
AU - ten Kate, Herman H.J.
PY - 1997/5/2
Y1 - 1997/5/2
KW - METIS-130433
M3 - Conference contribution
SN - 0-306-45374-6
SP - 1463
EP - 1470
BT - Proc. of the 11th International Materials Conference (ICMC)
CY - Columbus, Ohio
ER -
ten Haken B, Godeke A, ten Kate HHJ. Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. In Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio. 1997. p. 1463-1470