Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of the 11th International Materials Conference (ICMC)
    Place of PublicationColumbus, Ohio
    Number of pages8
    Publication statusPublished - 2 May 1997


    • METIS-130433

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