Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of the 11th International Materials Conference (ICMC)
    Place of PublicationColumbus, Ohio
    Pages1463-1470
    Number of pages8
    Publication statusPublished - 2 May 1997

    Keywords

    • METIS-130433

    Cite this

    ten Haken, B., Godeke, A., & ten Kate, H. H. J. (1997). Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. In Proc. of the 11th International Materials Conference (ICMC) (pp. 1463-1470). Columbus, Ohio.