Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProc. of the 11th International Materials Conference (ICMC)
    Place of PublicationColumbus, Ohio
    Pages1463-1470
    Number of pages8
    Publication statusPublished - 2 May 1997

    Keywords

    • METIS-130433

    Cite this

    ten Haken, B., Godeke, A., & ten Kate, H. H. J. (1997). Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. In Proc. of the 11th International Materials Conference (ICMC) (pp. 1463-1470). Columbus, Ohio.
    ten Haken, Bernard ; Godeke, A. ; ten Kate, Herman H.J. / Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio, 1997. pp. 1463-1470
    @inproceedings{4fbb3a43ebb54daebdebb62d6832a156,
    title = "Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains",
    keywords = "METIS-130433",
    author = "{ten Haken}, Bernard and A. Godeke and {ten Kate}, {Herman H.J.}",
    year = "1997",
    month = "5",
    day = "2",
    language = "Undefined",
    isbn = "0-306-45374-6",
    pages = "1463--1470",
    booktitle = "Proc. of the 11th International Materials Conference (ICMC)",

    }

    ten Haken, B, Godeke, A & ten Kate, HHJ 1997, Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. in Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio, pp. 1463-1470.

    Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. / ten Haken, Bernard; Godeke, A.; ten Kate, Herman H.J.

    Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio, 1997. p. 1463-1470.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains

    AU - ten Haken, Bernard

    AU - Godeke, A.

    AU - ten Kate, Herman H.J.

    PY - 1997/5/2

    Y1 - 1997/5/2

    KW - METIS-130433

    M3 - Conference contribution

    SN - 0-306-45374-6

    SP - 1463

    EP - 1470

    BT - Proc. of the 11th International Materials Conference (ICMC)

    CY - Columbus, Ohio

    ER -

    ten Haken B, Godeke A, ten Kate HHJ. Investigation of microscopic strain by X-ray diffraction in Nb3Sn tape conductors subjected to compressive and tensile strains. In Proc. of the 11th International Materials Conference (ICMC). Columbus, Ohio. 1997. p. 1463-1470