Investigation of the Formation of QuasicrystallineAl70-Pd20-Re10 Phase in situ during Annealing

Igor Alexandrovich Makhotkin, S.N. Yakunin, A.Y. Seregin, D.S. Shaitura, M.B. Tsetlin, E.Y. Tereshchenko

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The change in the phase composition of thinfilm layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3P phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al–Pd–Re phase is formed at 680°C.
Original languageUndefined
Pages (from-to)871-874
JournalCrystallography reports
Issue number5
Publication statusPublished - 2011


  • METIS-304862

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