Investigation of the Formation of QuasicrystallineAl70-Pd20-Re10 Phase in situ during Annealing

Igor Alexandrovich Makhotkin; S.N. Yakunin; A.Y. Seregin; D.S. Shaitura; M.B. Tsetlin; E.Y. Tereshchenko

doi:10.1134/S106377451105018X

Investigation of the Formation of QuasicrystallineAl70-Pd20-Re10 Phase in situ during Annealing

Igor Alexandrovich Makhotkin
, S.N. Yakunin
, A.Y. Seregin
, D.S. Shaitura
, M.B. Tsetlin
, E.Y. Tereshchenko

Laser Physics & Nonlinear Optics

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

The change in the phase composition of thinfilm layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3P phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al–Pd–Re phase is formed at 680°C.

Original language	Undefined
Pages (from-to)	871-874
Journal	Crystallography reports
Volume	56
Issue number	5
DOIs	https://doi.org/10.1134/S106377451105018X
Publication status	Published - 2011

Keywords

METIS-304862

Access to Document

10.1134/S106377451105018X

Cite this

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title = "Investigation of the Formation of QuasicrystallineAl70-Pd20-Re10 Phase in situ during Annealing",

abstract = "The change in the phase composition of thinfilm layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3P phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al–Pd–Re phase is formed at 680°C.",

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year = "2011",

doi = "10.1134/S106377451105018X",

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journal = "Crystallography reports",

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T1 - Investigation of the Formation of QuasicrystallineAl70-Pd20-Re10 Phase in situ during Annealing

AU - Makhotkin, Igor Alexandrovich

AU - Yakunin, S.N.

AU - Seregin, A.Y.

AU - Shaitura, D.S.

AU - Tsetlin, M.B.

AU - Tereshchenko, E.Y.

PY - 2011

Y1 - 2011

N2 - The change in the phase composition of thinfilm layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3P phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al–Pd–Re phase is formed at 680°C.

AB - The change in the phase composition of thinfilm layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3P phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al–Pd–Re phase is formed at 680°C.

KW - METIS-304862

U2 - 10.1134/S106377451105018X

DO - 10.1134/S106377451105018X

M3 - Article

SN - 1063-7745

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SP - 871

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JO - Crystallography reports

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