Investigation of the vicinal Ge(001) surface with STM

Bart A.G. Kersten, Lianda Sjerps-Koomen, Harold J.W. Zandvliet, Dave H.A. Blank

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Abstract

The morphology of Ge(001) has been investigated with a UHV - Scanning tunneling Microscope. The ge(001) surface was misoriented towards the [011] direction with a miscut angle varying from 0.4 to 5. The surface stress was found to have considerable influence on the step edge configuration as well as the position of the steps with respect to each other.
Original languageEnglish
Title of host publicationDetermining nanoscale physical properties of materials by microscopy and spectroscopy
Subtitle of host publicationsymposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.
EditorsMehmet Sarikaya, H. Kumar Wickramasinghe, Michael Isaacson
Place of PublicationPittsburgh, MA
PublisherMaterials Research Society
Pages555-560
Number of pages7
ISBN (Print)1-55899-231-6
Publication statusPublished - 1994
EventSymposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy 1993 - Boston, United States
Duration: 29 Nov 19933 Dec 1993

Publication series

NameMaterials Research Society Symposium Proceedings
PublisherMaterials Research Society
Volume332
ISSN (Print)0272-9172

Conference

ConferenceSymposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy 1993
CountryUnited States
CityBoston
Period29/11/933/12/93

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    Kersten, B. A. G., Sjerps-Koomen, L., Zandvliet, H. J. W., & Blank, D. H. A. (1994). Investigation of the vicinal Ge(001) surface with STM. In M. Sarikaya, H. K. Wickramasinghe, & M. Isaacson (Eds.), Determining nanoscale physical properties of materials by microscopy and spectroscopy: symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A. (pp. 555-560). (Materials Research Society Symposium Proceedings; Vol. 332). Pittsburgh, MA: Materials Research Society.