Investigation on induced degradation in a-Si: H TFTs

A.R. Merticaru, H. van Kranenburg, A.J. Mouthaan, Hendrikus de Vries, J. Hovius

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationMierlo, the Netherlands
    Publication statusPublished - 24 Nov 1999

    Keywords

    • METIS-114851

    Cite this

    Merticaru, A. R., van Kranenburg, H., Mouthaan, A. J., de Vries, H., & Hovius, J. (1999, Nov 24). Investigation on induced degradation in a-Si: H TFTs. Mierlo, the Netherlands.