Investigation on semiconductor devices under ESD zap conditions

G. Boselli, N. Golo-Tosic, A.J. Mouthaan, F.G. Kuper

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationEnschede, The Netherlands
    Publication statusPublished - 12 Oct 2000

    Keywords

    • METIS-114859

    Cite this

    Boselli, G., Golo-Tosic, N., Mouthaan, A. J., & Kuper, F. G. (2000, Oct 12). Investigation on semiconductor devices under ESD zap conditions. Enschede, The Netherlands.
    Boselli, G. ; Golo-Tosic, N. ; Mouthaan, A.J. ; Kuper, F.G. / Investigation on semiconductor devices under ESD zap conditions. 2000. Enschede, The Netherlands.
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    title = "Investigation on semiconductor devices under ESD zap conditions",
    keywords = "METIS-114859",
    author = "G. Boselli and N. Golo-Tosic and A.J. Mouthaan and F.G. Kuper",
    year = "2000",
    month = "10",
    day = "12",
    language = "Undefined",
    type = "Other",

    }

    Boselli, G, Golo-Tosic, N, Mouthaan, AJ & Kuper, FG 2000, Investigation on semiconductor devices under ESD zap conditions. Enschede, The Netherlands.

    Investigation on semiconductor devices under ESD zap conditions. / Boselli, G.; Golo-Tosic, N.; Mouthaan, A.J.; Kuper, F.G.

    Enschede, The Netherlands. 2000, .

    Research output: Other contributionOther research output

    TY - GEN

    T1 - Investigation on semiconductor devices under ESD zap conditions

    AU - Boselli, G.

    AU - Golo-Tosic, N.

    AU - Mouthaan, A.J.

    AU - Kuper, F.G.

    PY - 2000/10/12

    Y1 - 2000/10/12

    KW - METIS-114859

    M3 - Other contribution

    CY - Enschede, The Netherlands

    ER -

    Boselli G, Golo-Tosic N, Mouthaan AJ, Kuper FG. Investigation on semiconductor devices under ESD zap conditions. 2000.