Investigation on semiconductor devices under ESD zap conditions

G. Boselli, N. Golo-Tosic, A.J. Mouthaan, F.G. Kuper

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationEnschede, The Netherlands
    Publication statusPublished - 12 Oct 2000

    Keywords

    • METIS-114859

    Cite this

    Boselli, G., Golo-Tosic, N., Mouthaan, A. J., & Kuper, F. G. (2000, Oct 12). Investigation on semiconductor devices under ESD zap conditions. Enschede, The Netherlands.