Investigations on Double-Diffused MOS (DMOS) transistors under ESD zap conditions

G. Boselli, S. Meeuwsen, A.J. Mouthaan, F.G. Kuper

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)-
    JournalMicroelectronics reliability
    Volume2000
    Publication statusPublished - 2000

    Keywords

    • METIS-111627

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