Investigations on Double-Diffused MOS (DMOS) transistors under ESD zap conditions

G. Boselli, S. Meeuwsen, A.J. Mouthaan, F.G. Kuper

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined
Pages (from-to)	-
Journal	Microelectronics reliability
Volume	2000
Publication status	Published - 2000

Keywords

@article{8916e0b3d9bd4429b5f39c0f112df9bf,

title = "Investigations on Double-Diffused MOS (DMOS) transistors under ESD zap conditions",

keywords = "METIS-111627",

author = "G. Boselli and S. Meeuwsen and A.J. Mouthaan and F.G. Kuper",

year = "2000",

language = "Undefined",

volume = "2000",

pages = "--",

journal = "Microelectronics reliability",

issn = "0026-2714",

publisher = "Elsevier",

}