Abstract
We investigated the thermal stability of e-beam deposited Mo/B 4C/Si/B 4C layered systems, with and without ion assistance during the growth of the B 4C diffusion barrier layers. The thermal stability was investigated by in situ thermal annealing during grazing incidence X-ray reflection. By studying partially treated B 4C barrier layers, we found that the improvement in thermal stability is caused by an enhanced density of the B 4C layer. © 2012 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 064303 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 111 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 16 Mar 2012 |
Keywords
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